Toward a comprehensive understanding of solid-state core-level XPS linewidths: Experimental and theoretical studies on the Si 2p and O 1s linewidths in silicates
نویسندگان
چکیده
G. M. Bancroft,1,* H. W. Nesbitt,2 R. Ho,2 D. M. Shaw,3 J. S. Tse,3 and M. C. Biesinger4 1Department of Chemistry, University of Western Ontario, London, Ontario, Canada N6A 5B7 2Department of Earth Sciences, University of Western Ontario, London, Ontario, Canada N6A 5B7 3Department of Physics, University of Saskatchewan, Saskatoon, Saskatchewan, Canada S7N 5E2 4Surface Science Western, University of Western Ontario, London, Ontario, Canada N6A 5B7 Received 28 April 2009; published 4 August 2009
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